AI Applications in Semiconductor Packaging

Explore how AI is reshaping semiconductor packaging reliability in this two-hour recorded training.

  • 0.2 CEU / 2 PDH credits
  • Launched 2025
  • 1 course
  • 2 hours

Course Description

This two-hour live session examines how AI is reshaping semiconductor packaging reliability, comparing conventional approaches with advanced methods for predicting performance, analyzing failures, and optimizing lifecycle outcomes.

Course Objectives

  • Compare traditional and AI-driven approaches to semiconductor packaging reliability, gaining insight into how artificial intelligence transforms performance prediction and failure analysis.
  • Understanding key categories of AI, including machine learning (ML), deep learning, and generative AI–with distinctions between supervised, unsupervised, and generative models.
  • Explore neural networks for Semiconductor Packaging, specifically their components, including activation functions and neuron models, through analogies to human cognition and decision-making.
  • Discover select AI/ML techniques, such as Support Vector Machines, K-means clustering, Self-Organizing Maps, and Long-Short-Term Memory networks, and how they apply to packaging reliability.
  • Apply AI methods to real-world challenges in Semiconductor Packaging, including anomaly detection, machine state assessment, digital twin modeling, and forecasting the timing of future failures.

Authors and Instructors

Dr. Pradeep Lall

IEEE Fellow and MacFarlane Endowed Distinguished Professor at Auburn University

IEEE Fellow and MacFarlane Endowed Distinguished Professor at Auburn University, is a globally recognized leader in electronics packaging and reliability. As Director of the Auburn University Electronics Packaging Research Institute, he brings deep expertise shaped by prior work at Motorola and over 1,000 published journal and conference papers, along with two books and 15 chapters. He holds a Ph.D. in Mechanical Engineering from the University of Maryland and an MBA from Northwestern University, and has earned more than 50 best-paper awards plus major honors from IEEE, ASME, SMTA, SEMI, and NSF for his groundbreaking contributions to electronics manufacturing and design.